Atomic Force Microscopy (AFM) is a high-resolution imaging technique used to study surfaces at the atomic or molecular level. It works by scanning a sharp probe, known as a cantilever, across a sample’s surface to measure forces such as van der Waals forces, electrostatic forces, and mechanical interactions. These measurements produce detailed 3D images of the sample’s topography, enabling researchers to analyze its surface structure and properties. The illustration below demonstrates how an atomic force microscope captures images.
An illustration of an Atomic Force Microscope
Atomic Force Microscopy is useful in various fields, including materials science, nanotechnology, biology, and semiconductor research. Its ability to operate in air, liquid, or vacuum environments makes it versatile for studying a wide range of materials. These materials can range from metals and polymers to biological specimens. Unlike other microscopy techniques, AFM does not require complex sample preparation, making it a preferred choice for non-destructive analysis.
For more information on AFM and its applications, contact a surface engineer or explore articles in your field of interest.