Atomic Force Microscopy (AFM) measures surface topography at the nanoscale, providing high-resolution 3D images of a material’s surface. This advanced technique analyzes physical properties such as roughness, texture, and nanostructures by using a sharp probe that interacts with the surface at an atomic level. Beyond topography, AFM can measure mechanical properties like stiffness and elasticity, electrical conductivity, magnetic behavior, and even molecular interactions. Commonly used in materials science, biology, and nanotechnology, AFM helps researchers understand and optimize surfaces for applications in industries like electronics, coatings, and biomedical engineering.